tst01t00產(chǎn)品測(cè)試各階段的可測(cè)試性需求(編輯修改稿)
2025-04-20 05:06 本頁(yè)面
【文章內(nèi)容簡(jiǎn)介】 ebugging amp。 testing, which can make the system ing into or satisfying some special states.(2)The observation of software module debugging amp。 testing, usually the observation points and observation equipment are considered here, through which the system state can be visible by the output message, and we can know whether the system is under the certain state we need. （3）Software testability requirements are classified into three type, and they are product featureoriented testability requirements, buildin test capability and mon testability requirements. buildin test capability and mon testability requirments will be add into IPD end to end offering requirement, and during analysis of product design requirements, product featureoriented testability requirements will be analyzed based on analysis of product feature requirements.featureoriented testability requirements, which are proposed according to the actual features of a product. Such requirements are strongly relative to the feature of a products, and they are organized by different features.mon testability requires. such as memory management functions in a OS, they are mon to the public and not featureoriented to a particular product, they are called the mon testability requirements. such requirements could be organized by a featuretree as well, such as memory management feature, queue feature, and etc.buildintest capability requirements. they are the most mon part of a testing facility, and be called buildintest capability requirements. such requirements depicted the product under construction should support a certain kind of testing capability. for example, if we implement a tracking facility, it could well support the tracking and interfacing requirements from the above two kind of testability requirements. as the figure shown below are the infrastructure of the buildintest facilities:本部分需求主要來(lái)源于測(cè)試策略、經(jīng)驗(yàn)總結(jié)以及內(nèi)部訪談和調(diào)研分析。 軟件可測(cè)試性需求的分析詳細(xì)過(guò)程與方法，參見測(cè)試部相關(guān)支撐流程。Requirements here usually e from test strategy ,experience, interview. from Ramp。D test dept., you can get detailed supporting process and technical guide for software testability requirements. 、系統(tǒng)聯(lián)調(diào)中的可測(cè)性需求需求的關(guān)注點(diǎn)主要是能夠提供一些手段，這些手段是可以暴露問(wèn)題、發(fā)現(xiàn)問(wèn)題、定位問(wèn)題產(chǎn)生原因，解決問(wèn)題、以及驗(yàn)證解決效果的測(cè)試手段，主要考慮以下幾個(gè)方面的內(nèi)容：（1）測(cè)試數(shù)據(jù)源設(shè)計(jì)（2）業(yè)務(wù)和控制數(shù)據(jù)流的監(jiān)控和變更設(shè)計(jì)（3）子系統(tǒng)和模塊的故障分段環(huán)回及定位設(shè)計(jì)（4）子系統(tǒng)和模塊的自測(cè)試設(shè)計(jì)（5）測(cè)試儀器和工具的測(cè)試接口或兼容性設(shè)計(jì)（6）測(cè)試結(jié)果的記錄、分析和結(jié)果上報(bào)設(shè)計(jì)例如：系統(tǒng)聯(lián)調(diào)中如何區(qū)分不同單板、不同模塊之間的故障，出了故障后問(wèn)題是出在這個(gè)單板/模塊還是出在與之接口的那個(gè)單板/模塊，是我們經(jīng)常遇到的一個(gè)問(wèn)題。需要考慮相應(yīng)設(shè)計(jì)支持問(wèn)題的分段/分層定位。Testability requirements of joint system debuggingThe focus here is to provide some means, which can help us to learn about and find out the problems, find the reason of the problem, as well as solving methods and effectiveness of the problems. The following contents should be taken into consideration:(1)The design of testing data source .(2)The design for inspection and modification of system business flow and control data flow.(3)Segment loop and diagnose design for subsystems and modules.(4)The selftest design for subsystems and modules. (5)The design of interface or patibility design necessary for testing equipment and tools.(6)The recording, analyzing and reporting of testing result.本部分需求主要來(lái)源于聯(lián)調(diào)經(jīng)驗(yàn)、聯(lián)調(diào)測(cè)試策略以及內(nèi)部訪談和調(diào)研分析。Requirements here usually e from joint debugging experience and strategy, 、系統(tǒng)驗(yàn)證測(cè)試中的可測(cè)性需求系統(tǒng)驗(yàn)證測(cè)試是驗(yàn)證產(chǎn)品各種指標(biāo)性能是否達(dá)到設(shè)計(jì)要求，在不同環(huán)境下的指標(biāo)容限如何，包括指標(biāo)/接口層測(cè)試、功能/性能層測(cè)試、子系統(tǒng)/模塊層測(cè)試、應(yīng)用層測(cè)試、用戶層測(cè)試，其關(guān)注點(diǎn)主要在于系統(tǒng)驗(yàn)證測(cè)試各種測(cè)試項(xiàng)目能否實(shí)現(xiàn)、實(shí)現(xiàn)是否方便、出現(xiàn)問(wèn)題是否可以定位。 主要考慮以下幾個(gè)方面的內(nèi)容：（1）系統(tǒng)業(yè)務(wù)功能測(cè)試的可實(shí)現(xiàn)性和方便性（2）性能指標(biāo)測(cè)試與瓶頸定位的可實(shí)現(xiàn)性和方便性（3）系統(tǒng)告警功能驗(yàn)證測(cè)試的可實(shí)現(xiàn)性和方便性（4）系統(tǒng)容限/容錯(cuò)/極限性能測(cè)試的可實(shí)現(xiàn)性和方便性（5）協(xié)議跟蹤與驗(yàn)證測(cè)試的可實(shí)現(xiàn)性和方便性。 例如：針對(duì)系統(tǒng)驗(yàn)證測(cè)試中測(cè)試工作量比較大、重復(fù)次數(shù)較多的問(wèn)題，往往需要考慮對(duì)自動(dòng)測(cè)試的支持，提供自動(dòng)統(tǒng)計(jì)功能或者相應(yīng)的函數(shù)接口，便于自動(dòng)測(cè)試設(shè)計(jì)和執(zhí)行。對(duì)于異常容錯(cuò)測(cè)試往往需要考慮相應(yīng)的硬件接口或函數(shù)接口支持。有時(shí)候接口指標(biāo)測(cè)試時(shí)需要考慮測(cè)試儀器輔助信號(hào)的設(shè)計(jì)，提供測(cè)試儀器所需要的時(shí)鐘等信號(hào)接口供測(cè)試儀器使用。Testability Requirements for SVT System verification test is used for verif
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