材料科學(xué)中電子顯微鏡的各種技術(shù)介紹-資料下載頁
2024-12-31 21:30本頁面
【正文】 Dynamical Effect K M Pattern Kossel Pattern How to get a CBDP ZOLZ the Zero Order Laue Zone Thickness Measurement by CBDP 2222 1igi nts =???????? ?? )2(2 Bih kli ds ??? D=22222 111tnnsigii ???= ? HOLZ Higher Order Laue Zone Higher order Laue zone Determination of interplanar spacings parallel to the electron beam direction Indexing of the HOLZ maxima hu + kv + lw = 1 for FOLZ maxima hu + kv + lw = 2 for SOLZ maxima ?12221===kkHGkHG212220 )( WVUaPHUV W ??=???=21PFor fcc : When U+V+W odd When U+V+W even ???= 12PFor bcc : When UVW all odd When UVW all even 2122222 ))((1WcUVVUaH???=For Hex crystal: HOLZ Lines Higher Order Laue Zone Lines HOLZ lines Indexing of HOLZ lines Application of HOLZ lines Unit cell dimension Crystal symmetry Crystal defect ZAPS the zone Axis Patters Acquiring 3D symmetry information From Kossel pattern From KM pattern For SAD: 32 point groups are reduced to 11 projected diffraction groups For CBED: There are 31 diffraction groups which corresponds to 32 point groups 230 space groups can be deduced from point group and the element of micro symmetry screw axis and glide plane Phase identification s phase 演講完畢，謝謝觀看！
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