qc中的統(tǒng)計(jì)方法-資料下載頁
【導(dǎo)讀】一為什么要在質(zhì)量管理中學(xué)習(xí)SPC?程控制)理論和一些最新進(jìn)展。進(jìn)入21世紀(jì)，科學(xué)技術(shù)的發(fā)展越來越迅速。去實(shí)行3控制原則，在穩(wěn)態(tài)下的不合格率為，如此嚴(yán)格的質(zhì)量要求稱。面對(duì)如此新形式，推行質(zhì)。其中最大的一個(gè)原因就在于我們進(jìn)。行了工序分析，提高了質(zhì)量，提高了效率。技術(shù)人員的作用，而不僅僅是質(zhì)量管理人員。作為生產(chǎn)現(xiàn)場(chǎng)人員，了解一些質(zhì)量控制的思想也是非常有益的。精密的儀器、不管多精心的制造,都會(huì)有波動(dòng)。掌握了產(chǎn)品的質(zhì)量的統(tǒng)計(jì)分布，根據(jù)統(tǒng)。因而要從乍一看無規(guī)則的波動(dòng)中，找出規(guī)。計(jì)推斷的對(duì)象不同?，F(xiàn)在考察金屬線材的驗(yàn)收檢驗(yàn)。強(qiáng)度，根據(jù)測(cè)量的結(jié)果是否接收整批線材。品是否滿足要求。用標(biāo)準(zhǔn)差來表示。合所得數(shù)據(jù)，以期盡早發(fā)現(xiàn)該工序的異常。從總體中抽取的一部分，稱為樣。統(tǒng)計(jì)推斷，作為行動(dòng)的指南，具有現(xiàn)實(shí)作用。應(yīng)指出，由5個(gè)數(shù)據(jù)求出的值與100個(gè)數(shù)據(jù)求出的的值，從總體抽樣進(jìn)行測(cè)量，根據(jù)測(cè)量所得的數(shù)據(jù)推。到的因素就必須用因子分析的方法來測(cè)定.
【正文】 Percent01020304050x Curve: Normal(Mu= Sigma=)Percent05101520253035x34 38 42 46 50 54 58 62 66Curve: Exponential(Theta=0 Scale=)Percent01020304050607080x Basic Pareto Analysis1 2 3 4 5 6 7020406080100Percent020406080100CumulativePercentCause of FailureCategories: 1 Contamination 2 Oxide Defect 3 Silicon Defect4 Corrosion 5 Metallization 6 Doping7 MiscellaneousPareto Analysis by ProcessN = 1620102030405060PercentProcessAN = 1061 2 3 4 5 6 70102030405060PercentProcessBFailure Causes: 1 Contamination 2 Oxide Defect 3 Corrosion4 Silicon Defect 5 Doping 6 Metallization7 MiscellaneousCleaningProcessPareto Analysis by Process and DayMarch 1N = 32010203040506070PercentMarch 2N = 35March 3N = 34March 4N = 25March 5N = 36N = 301 2 3 4 5 6 7010203040506070PercentN = 271 2 3 4 5 6 7N = 171 2 3 4 5 6 7N = 161 2 3 4 5 6 7N = 161 2 3 4 5 6 7Failure Causes: 1 Contamination 2 Oxide Defect 3 Corrosion4 Metallization 5 Doping 6 Silicon Defect7 MiscellaneousWhere Did The Problems Occur?March 10510152025CountMarch 2 March 3 March 4 March 51 2 3 4 5 6 70510152025Count1 2 3 4 5 6 7 1 2 3 4 5 6 7 1 2 3 4 5 6 7 1 2 3 4 5 6 7Failure Causes: 1 Contamination 2 Oxide Defect 3 Corrosion4 Metallization 5 Doping 6 Silicon Defect7 MiscellaneousSeverity: Highest 2Status: With Controls Without ControlsFitted Beta Distribution of Plate Gaps50 MeasurementsSpecifications and Curve: Lower=Upper=Beta(Theta=0 Scale= a= b=)Percent051015202530Plate Gap in cm （ ； 3 （
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