【正文】 訓(xùn) ) 2023825 Continuous Improvement 14 Pareto ChartSep. 2023 Comment : 1. Scrap data is from product daily report in May2023 the Pareto Chart of Defect Item, chip, samll ID and Loss occupy % of total scrap qty . So they should be main improved. Main improve defects Small ID Chip Loss Continuous Improvement 15 Process Map Continuous Improvement 16 Identify KPIVs Man material Method Environment Lustration Dryness 5S Costume Technician skill Gauge Inspection criteria Inspection method WI (x) Operators skill (x) Machine Measure Kiln Grinding machine Pressing machine Speed Diamond wheel (x) Cleaning Stainless tray Press machine LCR meter Profile projector Samples P O2 Package Boxes Self control Consciousness Small ID WI training (x) Speed Plastic bags Work standard Cleaning room Air condition Powder Lot no Powder size Adapt the machine Press condition Firing profile Powder properties Washing procedure Continuous Improvement 17 Identify KPIVs Man material Method Environment Lustration Dryness 5S Costume Technician skill Gauge Inspection criteria Inspection method WI (x) Operators skill (x) Machine Measure Kiln Grinding machine Pressing machine Speed Diamond wheel (x) Cleaning Stainless tray Press machine LCR meter Profile projector Samples P O2 Package Boxes Self control Consciousness Chip WI training (x) Speed Plastic bags Washing procedure Work standard Cleaning room Air condition Powder Lot no Powder size Adapt the machine Press condition Firing profile Powder properties Continuous Improvement 18 FMEA Continuous Improvement 19 FMEA Continuous Improvement 20 Gage RR Small ID Continuous Improvement 21 Control Chart Control Chart ID dimension Comments : In Aug of 2023,Small ID actual scrap rate is %； Sigma level (Z Value) is S a m p l eSample Mean1 09876543211 . 8 01 . 7 91 . 7 81 . 7 71 . 7 6__X = 1 . 7 8U C L = 1 . 7 9 7 4 4L C L = 1 . 7 6 2 5 6S a m p l eSample Range1 09876543210 . 0 80 . 0 60 . 0 40 . 0 20 . 0 0_R = 0 . 0 3 0 2 4U C L = 0 . 0 6 3 9 4L C L = 011X b a r R C h a r t o f S 1 0 T 0 5 0 9 1 7Continuous Improvement 22 Potential KPIVs List ? According to analysis we found four potential KPIVs: 1. Pressing process— Pressing condition (SPI) 2. Firing process— Temperature settings 3. Grinding process— Washing procedure 4. Management process— Sourcing chain Continuous Improvement 23 ? Measure Phase Deliverables ? Developed the Pareto Charts ? Developed process mapping ? Developed Fishbone Diagram and FMEA ? Identified potential KPIVs Deliverables Conclusion ? Conclusion From Measure Phase ? We had confirmed the Measure system Gage R R is OK. ? Through Process map, Fishbone Diagram, C E Matrix, FMEA analysis , we found 4 KPIVs. ? We had made the Action Plan for 4 KPIVs. Continuous Improvement 24 Increase the yield of Grind Bead productsGB Laird Technologies Six Sigma GB Project Analysis Phase Continuous Improvement 25 Potential KPIVs Identified – Summary No KPIV Hypothesis Test 1 Pressing process— Pressing condition (SPI) Two samples 2 Firing process— Temperature settings Two samples 3 Grinding process— Washing procedure No need test 4 Management process— Sourcing chain Continuous Improvement 26 KPIV 1: Change the KPIV1 can impact the Small ID scrap rate. ? KPIV 1 Detail Pressing process— Pressing condition (SPI) Before: We set the average value around after firing samples. Change method: We set the average value around after firing samples. And since the pin will be damaged after per week. We will check if the pressing condition need to be changed weekly. ? Hypothesis Test ? Two samples test will be used to test this KPIV. ? Hypothesis Statement ? Ho : After change KPIV1, the ID distribution is as same as before. ? Ha : After change KPIV1, the ID distribution is not same as before. Continuous Improvement 27 KPIV 1: Change the KPIV1 can impact the Small ID scrap rate. Hypothesis Test (Small I