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??耗盡近似 21 ?????? ????Wxs表面勢 s?SAsWqN?22 2??1 2 3 2022/2/11 29 強反型判據 ????????????iABs nNqkTi nv ln22)(最大耗盡層寬度 AiAsABsmqNnNkTqNW???????????ln2)2(2??表面電荷 )2(2 BAssc NqQ ??? ?4 5 6 2022/2/11 30 閾值電壓 BOXmmCWW??? 2qNV,ATN理想條件下所以寬度達到最大的荷區(qū)達到強反型時,空間電電壓。強反型所需要達到的柵面達到閾值電壓:使半導體表2022/2/11 31 Surface Charge vs. Surface Potential 2022/2/11 32 The relationship between Wm and the impurity concentration for silicon and gallium arsenide, where NB is equal to NA for Ptype and ND for ntype semiconductor. Dielectric constant Si: GaAs: 2022/2/11 33 Capacitance at Low Frequency or quasistatic 2022/2/11 34 Capacitance in a MOS capacitor 小信號電容 MOS capacitance is defined as small signal capacitance and is measured by applying a small ac voltage on the top of a dc bias dtdVCdtdVdVdQdtdQI MMGMM ???理想 MOS電容器 2022/2/11 35 單位面積的微分電容 微分電容 C與外加偏壓 VG 的關系稱為 MOS系統(tǒng)的電容 — 電壓特性 。 若令 GMdVdQC ?MsMMGdQddQdVdQdVC???? 0100 dVdQC M?SSSMS ddQddQC?? ???2022/2/11 36 則 = 絕緣層單位面積上