[工學(xué)]電子顯微分析(編輯修改稿)
2025-01-03 23:44 本頁面
【文章內(nèi)容簡介】 t e d to approximately 70 degrees with respect to the horizontal. The diffraction pattern is imaged on a phosphor screen. The image is captured using a lowlight SIT or CCD camera. The bands in the pattern represent reflecting planes in the diffracting crystal volume. Thus, the geometrical arrangement of the bands is a function of the orientation of the diffracting crystal lattice. As the beam is moved from grain to grain the elect
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