ict測試原理及程式簡介-文庫吧資料
2025-05-05 04:57本頁面
【正文】 with floating metal tops/heat spreaders are testable! PCB AC Signal Ground VTEP Sensor plate C measured Electronics board (Amplifier) To Multiplex Card Metal BGA UnderTest Floating Metal Top TestJet測試能力的極限值為 20fF， VTEP測試能力的極限值為 5fF。否則會(huì)有漏掉真正短路的可能 . ? 不要輕易把節(jié)點(diǎn)放到測試文件的末尾，這樣可能造成開短路 覆蓋率的缺失，尤其是電源點(diǎn)或者 VCC這類本身就是低阻抗的節(jié)點(diǎn) . ? 調(diào)試時(shí) settling delay可以加的比較大，在優(yōu)化時(shí)再減小 Shorts Test Report Options report mon devices report limit 12 Short 1 From: D3 22044 To: D4 21938 Common Devices: U1 U4 report list, mon devices report limit 12 Short 1 From: D3 22044 To: D4 21938 Common Devices: u1 u4 report phantoms Short 1 From: D3 22044 To: D4 21938 Part 5 ? Analog Test ? capacitors ? connectors ? diodes ? FETs ? fuses ? inductors ? jumpers ? resistors ? switches ? transistors ? zeners Part 6 Testjet amp。 c).測量兩個(gè)節(jié)點(diǎn)之間的阻值，并判斷！ 語法如下： ! In the “shorts” file ! ! Syntax ! ! short “Node_1” to “Node_2” ! threshold 12 Settling delay 50u Settling delay 525u Shorts “L2011” to “L2012 Shorts Test (Good Board) Testing For Shorts 100mV 100 W “ A” “ B” “ C” “ D” “ E” “ F” “ G” “ Node_Names” Shorts Test (Bad Board) Testing For Shorts 100mV 100 W “ A” “ B” “ C” “ D” “ E” “ F” “ G” ? Which node is shorted to node C? A short has been detected from node C to one of the remaining nodes D, E, F or G Shorts Test (Bad Board) Testing For Shorts 100mV 100 W “ A” “ B” “ C” “ D” “ E” “ F” “ G” ? Which node is shorted to node C? A short has been detected from node C to one of the remaining nodes D, E, F or G Node C is not shorted to nodes D and E Node C is shorted to either nodes F or G Node C may be shorted to node G This is not assumed! Node C is shorted to node G 假象短路的調(diào)試 ? 假象短路出現(xiàn)的原因是特定的節(jié)點(diǎn)的測試順序造成誤判 ,必須在程序發(fā)布前排除 ? 方法是將出錯(cuò)的節(jié)點(diǎn)（或者節(jié)點(diǎn)群）挪到被短路的節(jié)點(diǎn) (或節(jié)點(diǎn)群）后面。 a).設(shè)置閥值為 12歐姆，如果 R測量12(threshold) ， 則測試 pass，反之， fail。隔離點(diǎn)無法 測 ) Pins Test “ A” “ B” “ C” “ D” “ E” “ F” “ G” “ Node_Names” + 10K DVM S Node E has no current flow. It is capacitively isolated and cannot be tested in Pins Test. Pins Test Syntax nodes A nod
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