ict測試原理及程式簡介-文庫吧在線文庫
【正文】 ypical IC with BoundaryScan Boundary Cells Core Logic Test Data In (TDI) Test Data Out (TDO) Test Mode Select (TMS) Test Clock (TCK) TEST ACCESS PORT CONTROLLER (TAP) The device can be controlled and tested through TDI, TCK, TMS, amp。 threshold low 350 high 10000 test pins 4, 5, 6。這個過程在調(diào)試中可能要重復(fù)幾次 ,挪動時最好在同一個 threshold設(shè)置群之內(nèi) . ? 可以自己設(shè)置 threshold，但是要遵循 threshold值從大到小的順序 , Threshold最低盡量不要設(shè)到 4以下，尤其是電源點。5% 氣壓 : 4－ 6KGF／CM2 TRI 518測試操作畫面 相匹配的治具簡介 相匹配的治具必需為真空治具 , 即治具下壓的動力為真空 . 真空治具根據(jù)繞線長度分為 : 長線治具 ,短線治具和無線治具 . 我們現(xiàn)在使用的治具為長線治具 . 治具內(nèi)部結(jié)構(gòu)如下 : SENSOR 壓棒 探針 彈簧 密封墊 氣管 油壓撐竿 雙絞線繞線 BUFFER BOARD Interface Introduction of Agilent 3070 Agilent 3070 Family 307X, up to 5200 nodes 327X, up to 1300 nodes 317X, up to 2600 nodes Anatomy of the Agilent Medalist 3070 Agilent 3070 Hardware Agilent 3070 Electronics Cabi DUT power supplies External Instruments Testhead Flat Screen Monitor on moveable arm. Keyboard on moveable arm. End Cabi contains Computer, Power Distribution Unit, Testhead rotation switch. Testhead Test Fixture Emergency Power Off Switch Test Fixture Mother Board (one per bank) Module power Supplies Agilent3070 測試畫面 Anatomy of the Agilent Medalist i3070 Fixture Probe to Pin Wiring Test Probe Support Plate Probe Plate Personality Pin Alignment Plate Printed Circuit Board Fixture Frame Vacuum Gasket R1 Stimulus Response Anatomy of the Agilent Medalist 3070 Agilent 3070 TestHead Bank 2 Bank 1 Module 2 Module 0 Module 3 Module 1 Slot 1 Slot 1 Slot 1 Slot 1 Slot 1: ASRU Slot 6: Module Control Card All others: Pin Cards Pin 78 1 Pin 1 78 Fixture Numbering BRC: Bank Row Column Bank 2 Bank 1 Module 2 Module 3 Module 0 Module 1 Slot 1: ASRU Slot 6: Control Slot 1: ASRU Slot 6: Control Slot 1: ASRU Slot 6: Control Slot 1: ASRU Slot 6: Control MOTHER BOARD MOTHER BOARD Row 1 Row11 Row 13 Row 23 Row 1 Row11 Row 13 Row 23 Column 78 1 78 1 1A at: 2 20 61 CLOCK_ENABLE at: 2 18 48 Double Density node at: 2 20
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鄂ICP備17016276號-1