表面分析方法ppt課件(2)(參考版)
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【正文】 2022/2/12 HNUZLP 48 Viscoelasticity Friction Force Adhesive Force Glass trans. Phase Hardness Polymer characterization in nanoscale level VEAFM/DFM FFM/LMFFM PM Adhesion Material Characterization using SPM 2022/2/12 HNUZLP 49 Biology and Biomaterials ? Applications for Contact Lens Manufacturing ? Applications for the Biological Sciences ? Direct Measurement of single Immunoplex Formation ? High Resolution Imaging of Biological Samples by SPM Materials Science ? Electrical Testing Application Modules for Nano Scope ? Surface Potential Imaging and Surface Electric Modification ? Studies of Metallic Surfaces and Microstructures ? Engineering Low Scatter Thin Film Optics ? Electrochemical Applications ? Nanoindentation, Scratching and Wear Testing Applications of AFM 2022/2/12 HNUZLP 50 Polymers highresolution profiling of surface morphology, nanostructure, and molecular order studies of local materials properties positional mapping of heterogeneous samples probing of subsurface sample structure Semiconductors ? Atomic Force Profilometry for Characterzation of Chemical Mechanical Planarization ? Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors ? Atomic Force Microscopy Measurements in Support of Chemical Mechanical Polishing (CMP) ? IC Failure Analysis and Defect Inspection with SPM Data Storage ? Magic Force Microscopy: HighResolution Imaging for Data Storage ? Applications of Atomic Force Microscopy in Optical Disc Technology 2022/2/12 HNUZLP 51 Phase Separation Structure ?ABS resin ?PC/AES alloy ?PC/ABS alloy ?ABS/PVC alloy etc Lamella Structure ?LD, MD, HD Polyethylene ?Linear LD Polyethylene ?UH Molecular Weight PE ?Polypropylene etc Next Generation ?Conducting Polymer ?Organic EL ?Biodegradable Polymer etc Thermoplastic Elastomer ?Styrene Butadiene ?Polyester ?Polyvinyl Chloride etc SPM Application in Polymer Material 2022/2/12 HNUZLP 52 Studies of Polymer Surfaces with AFM 研究?jī)?nèi)容：高分子形態(tài)、納米結(jié)構(gòu)、 鏈堆砌和構(gòu)象等 手段： Contact Mode AFM LFM Tapping Mode 2022/2/12 HNUZLP 53 ? highresolution profiling of surface morphology, nanostructure, and molecular order ? studies of local materials properties ? positional mapping of heterogeneous samples ? probing of subsurface sample structure 2022/2/12 HNUZLP 54 【Purpose】 ◆ Distribution of the characteristics change in the polymer surface can be observed. 【Principle】 ◆ Detecting the phase change in DFM measurement 【Advantage】 ◆ Simultaneous imaging with DFM ◆ S
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