礦物材料現(xiàn)代測試技術(shù)1緒論(參考版)
2024-10-19 19:47本頁面
【正文】 . 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 20 Morphological properties (Surface observation) To observe the surface characteristic of the material. Macro – Micro – Super Micro: Macro by naked eyes. Micro by microscope , electron microscope… Super Micro Scanning tunneling microscopy Atomic force microscopy 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 21 To observe the shape of the particles, their boundary characteristic , in some cases, to observe atom arrangement directly. Generally, the morphological analysis is bined with chemical analysis. It is called microregion analysis ( both chemical and morphological analysis) 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 22 Analysis of physical and chemical properties Including Thermal, Light, electricity, mechanics, etc. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 23 2. Analyzing Methods 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 24 Chemical Composition Wet Chemical Analysis: (solid, liquid, gas) liquid chemical reaction calculating chemical analyzing result 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 25 Silicate analysis (including oxides) used for most of the material: (It is called 13 items analysis) SiO2, Al2O3, MgO, FeO, Fe2O3, CaO, K2O, Na2O, MnO, TiO2, P2O5, (H2O)+, (H2O) percent (%wt), Bulk sample (), long period (2 weeks) Generally 2 validating digits after point. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 26 Adsorption spectroscope (Instrument analysis) (solid, liquid, gas) liquid adsorption spectroscopy measuring (different cation adsorbs different wavelength of light) General concentration (%wt) to micro (ug/g) and also to hint concentration (ng/g) 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 27 a) AADS (Atom Adsorption Spectroscope) Mainly used to determine micro elements (about all elements in the Element Table) From general concentration to micro concentration ( %wt to ug/g) b) ICP( Plasma) Mainly used to determine micro to hint elements (most of the elements in the Table can be determined) (ug/g ng/g) 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 28 Radiating Spectroscope light source solid sample second light (the wavelength of the 2nd light changes according to the kind of the elements in the solid sample) measuring the 2nd light wavelength, so the kinds and the contents of the elements in the material can be determined. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 29 a) x ray Fluorescence Spectroscope (XRF) X射線熒光光譜儀 General to micro concentration (%wt— ug/g). Light source : x ray with continues wave length. Sample: solid. the elements from Na11U92. but can not distinguish the different charges of the same element: Fe2+ and Fe3+… b) X ray Photoelectron Spectroscope (XPS) X射線光電子（能）譜儀 Mainly to ide
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