左手材料-負折射率材料-資料下載頁
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【正文】 e setup used in the Snell’s law experiment showing the conical horn, lens, sample, and waveguide detector. The measurements were made in the focused and collimated mode at 33 and 66 cm away from the sample. Parazzoli C. G. ,Greegor R. B. ,et al , Phys. Rev. Lett. ,2021,90,107401 Fig 8. Surface plot of measured normalized Ez(r,f ). Refracted peaks :by Teflon at 176。 (n=) and is independent of frequency。 by the NIM , however, at , 176。 (n=) that are a function of the frequency.. Fig 9. (a) Measured angular profile of the normalized Ez(r), at f = GHz for detector distances of 33 and 66 cm from the wedges. (b) Measured 33 cm data pared to simulated results at 33, 66, and 238 cm (100? )from the wedges. Fig 10. Perfect lensing in action: (A) the far field and (B) the near field, translating the object into a perfect image. (C) Microwave experiments* demonstrate that subwavelength focusing is possible, limited only by losses in the system. (D) Measured data pared to the perfect results. Losses limit the resolution to less than perfect but better than the diffraction limit. C D * Grbic A. ,Eleftheriades G. , Phy. Rev. Lett. ,2021,92,117403 222 1 ??? p?? 20222 1 ???????F22m p m o220 m o() 1i? ? ??? ??? ? ? ? ? ? ??mo－磁共振頻率； ?mp－磁等離子化頻率 ?eo－電子共振頻率； ?ep－電等離子化頻率 22ep eo220 eo() 1i? ? ??? ??? ? ? ? ? ? ?只要 ?0 ? ?p， ?、 ?就可以同時為負數(shù)。
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