【正文】 的理論知識多、技能要求高、工作范圍廣、綜合性強，我得到了全面鍛煉。在本次設計之后，我們基本上獲得了預期的收獲，有效的達到了畢業(yè)設計的目的和要求，完成了設計的任務。 sbit EN =P2^2。void Delay ( uint ms ) // 延時{ unchar i。}unchar Read_LCD_state ( ){ unchar state 。 //開始讀 Delay ( 1 ) 。 return state 。 }void write_LCD_mand ( unchar cmd ) //寫LCD命令{ LCD_Busy_wait ( ) 。 P0=cmd。}void write_LCD_data ( unchar dat ) //寫LCD命令數(shù)據(jù){ LCD_Busy_wait ( ) 。 P0=dat。}void Intialize_LCD ( ){ void write_LCD_mand ( 0x38) 。 void write_LCD_mand ( 0x06) 。} Void showstring( unchar x,unchar y,unchar *str) { unchar i=0。 i16。a[2]=((d%1000)%100)/10+’0’。 _NOP_。void startc ( ){ SDAC=1。 NOP4( )。 NOP4( )。}void RASKC ( ){ SDAC=1。 SDAC=1。 SCLC=0。 i8。 SCLC=1。}Void write_IICC( unchar addr ,unchar dat ){ Startc( )。 stopc( )。 i8。 SCLC=0。 write_A_Bytec( 0xa1 )。 Return d。 stop( )。void start ( ){ SDA=1。 NOP4( )。 NOP4( )。}void RASK ( ){ SDA=1。 SDA=1。 SCL=0。 i8。 SCL=1。}Void write_IIC( unchar addr ,unchar dat ){ Start( )。 stop( )。 i8。 SCL=0。 write_A_Byte( 0xa1 )。 Return d。 stop( )。 electricity++。Void write_IIC(0x03 , count )。sbit P1_0=P1^0。p1_6=1。 TMOD=0x03。remnant= Random_Read( 0x02 )。 If(P1_5==1){showstring( 0x0100,0, string[2])。else showstring( 0x0100,0, string[3])。}else showstring( 0x0100,0, string[5]。}else {P1_0=0。}}附錄三 中英文資料The General Situation of AT89C51Chapter 1 The application of AT89C51Microcontrollers are used in a multitude of mercial applications such as modems, motorcontrol systems, air conditioner control systems, automotive engine and among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such highspeed eventbased applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the ponent and at the system level. Intel Platform Engineering department developed an objectoriented multithreaded test environment for the validation of its AT89C51 automotive microcontrollers. The goals of this environment was not only to provide a robust testing environment for the AT89C51 automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future microcontrollers. The environment was developed in conjunction with Microsoft Foundation Classes (AT89C51). The paper describes the design and mechanism of this test environment, its interactions with various hardware/software environmental ponents, and how to use AT89C51. IntroductionThe 8bit AT89C51 CHMOS microcontrollers are designed to handle highspeed calculations and fast input/output operations. MCS 51 microcontrollers are typically used for highspeed event control systems. Commercial applications include modems, motorcontrol systems, printers, photocopiers, air conditioner control systems, disk drives, and medical instruments. The automotive industry use MCS 51 microcontrollers in enginecontrol systems, airbags, suspension systems, and antilock braking systems (ABS). The AT89C51 is especially well suited to applications that benefit from its processing speed and enhanced onchip peripheral functions set, such as automotive powertrain control, vehicle dynamic suspension, antilock braking, and stability control applications. Because of these critical applications, the market requires a reliable costeffective controller。}Format(electricity, e)Format(remnant, r)showstring( 0x0100,0, e)。if(electricity==0){P1_0=1。write_IICC(0x02 , 0 )。remnant= remnant+ Random_Readc( 0x01)。While( 1 ){ if(P1_2==0 ) { delay( 1 )。showstring( 0x0100,0, string[1])。 IP=0x01。Intialize_LCD( )。 unchar *string[]={“l(fā)ow power”,”electrograph”,”reading”,”ok”,”emport”,”wrong card”}。} ****************************************************************//掉電中斷(INT0)Void EX_INT0( ) interrupt 0{ Void write_IIC( 0x01 , electricity )。}****************************************************************//定時器0中斷Void T0_INT( ) intrerrpt 1{ count++。 write_A_Byte( 0xa0 )。 NO_ACK( )。} Unchar Read_Current( ){ Unchar d。 b=1。}Unchar Read_A_Byte( ){ Unchar i, b。 write_A_Byte( addr )。 SCL=0。 SDA=CY。}Void write_A_Byte( unchar b ){ Unchar i。 SCK=1。 NOP4( )。 SCL=0。} void stop ( ){ SDA=0。 NOP4( )。}sbit SDA=P3^0。 write_A_Bytec( 0xa0 )。 NO_ACKC( )。} Unchar Read_Currentcc( ){ Unchar d。 b=1。}Unchar Read_A_Bytec( ){ Unchar i, b。 write_A_Bytec( addr )。 SCLC=0。 SDAC=CY。}Void write_A_Bytec( unchar b ){ Unchar i。 SCKC=1。 NOP4( )。 SCLC=0。} void stopc ( ){ SDAC=0。 NOP4( )。}sbit SDAC=P1^3。 }****************************************************************// define NOP4( ) { _NOP_。}}Void format ( unchar d, unchar*a) { a[0]=d/1000+’0’。 If (y==1) write_LCD_mand ( 0xc0|x)。 void write_LCD_mand ( 0x0c) 。 void write_LCD_mand ( 0x01) 。 Delay( 1 ) 。 RW=0。 Delay( 1 ) 。 RW=0。0x08 ) ==0x08 。 EN =0。 // 寄存器選擇 RW=1。 i12。 sbit P1_5=P1^5。最后衷心感謝在百忙之中評閱論文和參加答辯的各位專家、教授!附錄一 總體電路圖附錄二 部分程序************************************************************ ************// include include include unchar unsigned char include uint unsigned int sbit RS =P2^0。在培養(yǎng)運用專業(yè)知識、分析和解決實際問題的能力，科學研究的思維能力、探究能力和創(chuàng)新能力上，有著積極地促進作用。XXX老師孜孜不倦探索及忘我工作之舉是我學習的模范。參考文獻[1] 馬忠梅等，單片機的C語言應用程序設計（第四版）． [2] 馮文旭卡插入檢測要去抖動，要有卡短路檢測，可進行多一次的卡復位操作，卡流水號，密碼都要與本機規(guī)格號相同。即使寫錯，誤差也不大。數(shù)據(jù)雙備份。每一部分設置一寫入指令。但在程序指令PC出錯時，若改變剩余電能寄存器并把錯誤的數(shù)據(jù)寫入EEPROM中，這是不允許的。 IC卡接口電路IC卡作為數(shù)據(jù)交換的紐帶，非常重要。177。③線性電源：這種電源穩(wěn)壓性能好，隔離性好，價