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化學檢測相關中英文對照(參考版)

2025-06-12 23:27本頁面
  

【正文】 llenstedt fringes use to determine thickness KM條紋9用于確定試樣厚度)KosselM246。TEM: Subject index6Aberration 像差chromatic 色差spherical 球差astigmatic 像散Absorption coefficient 吸收系數(shù)abnormal 反常吸收系數(shù)uniform 均勻吸收系數(shù)Aperture 光闌objective aperture 物鏡光闌selective area aperture 選區(qū)光闌condenser lens aperture 聚光鏡光闌size 光闌尺寸Astigmatism 像散Anomalous absorption coefficient 反常吸收系數(shù)Alignment of electron microscope 電子顯微鏡的對準Antiphase domains 反相疇Antiphase domain boundaries 反相疇界Artefacts in specimens 樣品中的人為缺陷Atomic scattering amplitude 原子散射振幅Back focal plane 后焦面Beam current density 束流密度Beam direction 電子束方向Bend contours 彎曲條紋Bend center 彎曲中心Bend extinction contours 彎曲消光條紋Bright field 明場Bright field image 明場像Burgers vector determinations 柏氏矢量確定Calibration of electron microscope 電子顯微鏡的校準Camera constant 相機常數(shù)Camera length 相機長度Cavities 空洞Characteristic images from a perfect crystal 完整晶體特征圖像thickness fringes 厚度消光條紋bend extinction contours 彎曲消光條紋bend contours 彎曲條紋bend center 彎曲中心Chemical polishing for specimen preparation 試樣的化學拋光Chromatic abberation 色差Coherency of precipitates 沉淀相的共格性Coherency strain contrast 共格應變襯度Column approximation 晶柱近似Condenser lens 聚光鏡Constrained strain 約束應變Dark field 暗場Darkfield images 暗場像Defocus 欠焦Deformation of specimen 試樣變形Depth of field 景深Depth of focus 焦深Deviation parameter 偏移參量effective value of 有效偏移參量Diffraction contrast 衍射襯度Diffraction function 衍射函數(shù)Diffraction mode 衍射模式Diffraction pattern 衍射花樣Diffraction theory 衍射理論Direct lattice images 直接點陣像Dislocations 位錯contrast from 位錯襯度density of 位錯密度determination of Burgers vector of 位錯柏氏矢量的確定displacement fields around 圍繞位錯的位移場nodes 位錯結perfect (whole) 完全位錯partial 不全位錯Displacement fringe contrast from precipitates 沉淀相粒子的位移條紋襯度Domain boundaries 疇界Double condenser lens 雙聚焦透鏡Double diffraction 雙衍射Dynamical theory of electron diffraction 電子衍射的動力學理論Edwald sphere 厄瓦爾德球Effective value 有效(值)deviation parameter 有效偏移參量extinction distance 有效消光距離Electron beam 電子束transmitted 透射(電子)束diffracted 衍射(電子)束Electron diffraction 電子衍射Electron diffraction patterns 電子衍射花樣accuracy of 電子衍射花樣的精度calibration of 電子衍射花樣的校準effects of crystal shape 電子衍射花樣的形狀效應indexing of 電子衍射花樣的標定Kikuchi lines 菊池線花樣polycrystalline ring 多晶環(huán)狀衍射花樣single crystal spot 單晶斑點衍射衍射streaks on 電子衍射花樣的芒線Electron gun 電子槍Electron microscope 電子顯微鏡analytical 分析電鏡attachments for 電子顯微鏡的附件high resolution 高分辯電鏡magnification of 電子顯微鏡的放大倍數(shù)ray diagrams for 電子顯微鏡的光路圖resolving power of 電子顯微鏡的分辯力transmission 透射電鏡Electron microscopy 電子顯微學(術)analytical 分析電子顯微學(術)conventional 常規(guī)電子顯微學high resolution 高分辯電子顯微學(術)transmission 透射電子顯微學Electron wavelengths 電子波長Electropolishing for specimen preparation 電解拋光制備電鏡試樣Extinction 消光Extinction contours 消光條紋Extinction distance 消光距離Extrinsic 插入型的Faults 缺陷Focus distance 焦距Foil thickness 薄膜厚度measurement of 膜厚測量Fringes 條紋displacement 位移條紋magnetic domain wall 磁疇壁條紋moire Moirre條紋precipitates, from 由沉淀相粒子引起的 條紋stacking fault 層錯條紋thickness 厚度條紋Goniometer stage 測角臺Heating stages 加熱臺High order Laue Zone 高階勞厄區(qū)High resolution electron microscopy 高分辯電鏡Identification of precipitates 沉淀相鑒別Illumination of specimen 試樣照明contamination by 試樣照明引起的污染damage by 試樣照明引起的破壞Image 圖像br
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