【正文】
φ ms=。 平帶情況 ( =0) 平帶電容由摻雜濃度和氧化層厚度確定 GV0CSQSCGV000 11xLCCsDFB????S??????????02002prsD pqTkL ??德拜長 度 2022/2/11 39 Depletion dsisasisdd WqNdQdC ?? ??????2)(soxsaisoxdag CqNCWqNV ??????? ?2)2(1 2 asigoxoxqNVCCC???oxC DC請推導(dǎo)此表達(dá)式 2022/2/11 40 耗盡區(qū) ( 0) GV00011。 當(dāng)負(fù)偏壓的數(shù)值逐漸減少時 , 空間電荷區(qū)積累的空穴數(shù)隨之減少 , 并且 隨 的變化也逐漸減慢 , 變小 。 稱為系統(tǒng)的歸一化電容 。強(qiáng)反型所需要達(dá)到的柵面達(dá)到閾值電壓:使半導(dǎo)體表2022/2/11 31 Surface Charge vs. Surface Potential 2022/2/11 32 The relationship between Wm and the impurity concentration for silicon and gallium arsenide, where NB is equal to NA for Ptype and ND for ntype semiconductor. Dielectric constant Si: GaAs: 2022/2/11 33 Capacitance at Low Frequency or quasistatic 2022/2/11 34 Capacitance in a MOS capacitor 小信號電容 MOS capacitance is defined as small signal capacitance and is measured by applying a small ac voltage on the top of a dc bias dtdVCdtdVdVdQdtdQI MMGMM ???理想 MOS電容器 2022/2/11 35 單位面積的微分電容 微分電容