【導讀】1．掌握程序設計的一般方法；采用2片AT89C52單片機構成主從式的控制系統(tǒng)，雙機采用串行口進行通信。對小車進行紅外遙控，實現(xiàn)小車的直線行駛，曲線行駛，超聲波測障等功能。4．電子線路PCB布線圖的繪制。1．設計硬件電路，以AT89C52單片機為控制核心，要求能夠控制小車的啟動、前進、左轉(zhuǎn)、右轉(zhuǎn)、停止等功能。2．設計相應的狀態(tài)指示燈。3．各部分環(huán)節(jié)的原理分析及調(diào)試故障分析和排除方法；4．畢業(yè)設計論文內(nèi)插圖必須用電腦制作。主單片機負責紅外遙控接收、顯示、小車的運動以及處理遙控命令等功能；從單片機則主要負責超聲波測障這項功能，在探測到障礙時將有關信息報告給主單片機進行處理，并由主單片機來采取相應的措施。鑒于本設計不需要遠距離遙控，所以綜合考慮之下采用紅外遙控較為合適。從單片機主要完成超聲波測障工作，超聲波測障模塊由AT89C52控制器、超聲波發(fā)射電路、超聲波接收電路、聲音報警電路組成。

　　

【正文】 ions such as ASTM, JEDEC, and MILSTD 883. Typically, TID (Co60) and SEE (heavy ion and/or proton) are required for device validation. So what is unique to HBD devices? As opposed to a “regular” mercialofftheshelf (COTS) device or application specific integrated circuit (ASIC) where no hardening has been performed, one needs to determine how validated is the design library as opposed to determining the device hardness. That is, by using test chips, can we “qualify” a future device using the same library? Consider if Vendor A has designed a new HBD library portable to foundries B and C. A test chip is designed, tested, and deemed acceptable. Nine months later a NASA flight project enters the mix by designing a new device using Vendor A’s library. Does this device require plete radiation qualification testing? To answer this, other questions must be plete was the test chip? Was there sufficient statistical coverage of all library elements to validate each cell? If the new NASA design uses a partially or insufficiently characterized portion of the design library, full testing might be required. Of course, if part of the HBD was relying on inherent radiation hardness of a process, some of the tests (like SEL in the earlier example) may be waived. Other considerations include speed of operation and operating voltage. For example, if the test chip was tested statically for SEE at a power supply voltage of , is the data applicable to a 100 MHz operating frequency at ? Dynamic considerations (., nonstatic operation) include the propagated effects of Single Event Transients (SETs). These can be a greater concern at higher point of the considerations is that the design library must be known, the coverage used during testing is known, the test application must be thoroughly understood and the characteristics of the foundry must be known. If all these are applicable or have been validated by the test chip, then no testing may be necessary. A task within NASA’s Electronic Parts and Packaging (NEPP) Program was performed to explore these types of considerations.III. HBD TECHNOLOGY EVALUATION USING THE 8051 MICROCONTROLLERWith their increasing capabilities and lower power consumption, microcontrollers are increasingly being used in NASA and DOD system designs. There are existing NASA and DoD programs that are doing technology development to provide HBD. Microcontrollers are one such vehicle that is being investigated to quantify the radiation hardness improvement. Examples of these programs are the 8051 microcontroller being developed by Mission Research Corporation (MRC) and the IAμE (the focus of this study). As these HBD technologies bee available, validation of the technology, in the natural space radiation environment, for NASA’s use in spaceflight systems is 8051 microcontroller is an industry standard architecture that has broad acceptance, wideranging applications and development tools available. There are numerous mercial vendors that supply this controller or have it integrated into some type of systemonachip structure. Both MRC and IAμE chose this device to demonstrate two distinctly different technologies for hardening. The MRC example of this is to use temporal latches that require specific timing to ensure that single event effects are minimized. The IAμE technology uses ultra low power, and layout and architecture HBD design rules to achieve their results. These are fundamentally different than the approach by AeroflexUnited Technologies Microelectronics Center (UTMC), the mercial vendor of a radiation– hardened 8051, that built their 8051 microcontroller using radiation hardened processes. This broad range of technology within one device structure makes the 8051an ideal vehicle for performing this technology evaluation.The objective of this work is the technology evaluation of the CULPRiT process [3] from IAμE. The process has been baselined against two other processes, the standard 8051 mercial device from Intel and a version using stateoftheart processing from Dallas Semiconductor. By performing this sidebyside parison, the cost benefit, performance, and reliability trade study can be the performance of the technology evaluation, this task developed hardware and software for testing microcontrollers. A thorough process was done to optimize the test process to obtain as plete an evaluation as possible. This included taking advantage of the available hardware and writing software that exercised the microcontroller such that all substructures of the processor were evaluated. This process is also leading to a more plete understanding of how to test plex structures, such as microcontrollers, and how to more efficiently test these structures in the future.IV. TEST HARDWAREThe 8051 Device Under Test (DUT) was tested as a ponent of a functional puter. Aside from DUT itself, the other ponents of the DUT puter were removed from the immediate area of the irradiation beam. A small card (one per DUT package type) with a unique hardwired identifier byte contained the DUT, its crystal, and bypass capacitors (and voltage level shifters for the CULPRiT DUTs). This DUT Board was connected to the Main Board by a short 60conductor ribbon cable. The Main Board had all other ponents required to plete the DUT Computer, including some which nominally are not necessary in some designs (such as external RAM, external ROM and address latch).The DUT Computer and the Test Control Computer were connected via a serial cable and munications were established between the two by the Controller (that runs custom designed serial interface software). This Controller software allowed for manding of the DUT, downloading DUT Code to the DUT, and realtime error collection from the DUT during and post irradiation. A 1 Hz signal source provided an external watchdog timing signal to the DUT, whose watchdog output was monitored via an oscilloscope. The power supply was monitored to provide indic