【正文】 ne NOP4( ) { _NOP_。 _NOP_。 _NOP_。 _NOP_。}sbit SDAC=P1^3。sbit SCLC=P1^4。void startc ( ){ SDAC=1。 SCLC=1。 NOP4( )。 SDAC=0。 NOP4( )。 SCLC=0。} void stopc ( ){ SDAC=0。 SCKC=1。 NOP4( )。 SDAC=1。 SCLC=0。 NOP4( )。}void RASKC ( ){ SDAC=1。 SCKC=1。 NOP4( )。 SCLC=0。 SDAC=1。}Void NO_ACKC ( ){ SDAC=1。 SCKC=1。 NOP4( )。 SCLC=0。 SDAC=0。}Void write_A_Bytec( unchar b ){ Unchar i。 For( i=0。 i8。 i++) { b=1。 SDAC=CY。 _NOP_( )。 SCLC=1。 NOP4( )。 SCLC=0。 } RACKC( )。}Void write_IICC( unchar addr ,unchar dat ){ Startc( )。 write_A_Bytec( 0xa0 )。 write_A_Bytec( addr )。 write_A_Bytec( dat )。 stopc( )。Delay( )。}Unchar Read_A_Bytec( ){ Unchar i, b。For( i=0。 i8。 i++){ SCLC=1。 b=1。 b∣=SDAC。 SCLC=0。} Return b。} Unchar Read_Currentcc( ){ Unchar d。 Startc( )。 write_A_Bytec( 0xa1 )。 d= Read_A_Bytec( )。 NO_ACKC( )。 Stopc( )。 Return d。}Unchar Random_Readc( unchar addr ){ Startc( )。 write_A_Bytec( 0xa0 )。 write_A_Bytec( addr )。 stop( )。 return Read_Currentc( )。}sbit SDA=P3^0。sbit SCL=P3^1。void start ( ){ SDA=1。 DCL=1。 NOP4( )。 SDA=0。 NOP4( )。 DCL=0。} void stop ( ){ SDA=0。 SCK=1。 NOP4( )。 SDA=1。 SCL=0。 NOP4( )。}void RASK ( ){ SDA=1。 SCK=1。 NOP4( )。 SCL=0。 SDA=1。}Void NO_ACK ( ){ SDA=1。 SCK=1。 NOP4( )。 SCL=0。 SDA=0。}Void write_A_Byte( unchar b ){ Unchar i。 For( i=0。 i8。 i++) { b=1。 SDA=CY。 _NOP_( )。 SCL=1。 NOP4( )。 SCL=0。 } RACK( )。}Void write_IIC( unchar addr ,unchar dat ){ Start( )。 write_A_Byte( 0xa0 )。 write_A_Byte( addr )。 write_A_Byte( dat )。 stop( )。Delay( )。}Unchar Read_A_Byte( ){ Unchar i, b。For( i=0。 i8。 i++){ SCL=1。 b=1。 b∣=SDA。 SCL=0。} Return b。} Unchar Read_Current( ){ Unchar d。 Start( )。 write_A_Byte( 0xa1 )。 d= Read_A_Byte( )。 NO_ACK( )。 Stop( )。 Return d。}Unchar Random_Read( unchar addr ){ Start( )。 write_A_Byte( 0xa0 )。 write_A_Byte( addr )。 stop( )。 return Read_Current( )。}****************************************************************//定時(shí)器0中斷Void T0_INT( ) intrerrpt 1{ count++。 If (count== degree) { count=0。 electricity++。 remnant。} ****************************************************************//掉電中斷(INT0)Void EX_INT0( ) interrupt 0{ Void write_IIC( 0x01 , electricity )。Void write_IIC(0x02 , remnant )。Void write_IIC(0x03 , count )。 }****************************************************************//主程序Void main( ){ unchar count , degree, , electricity。 unchar *string[]={“l(fā)ow power”,”electrograph”,”reading”,”ok”,”emport”,”wrong card”}。unchar *e, *r。sbit P1_0=P1^0。sbit P1_1=P1^1。Intialize_LCD( )。P1_2=1。p1_6=1。 IE=0x83。 IP=0x01。 IT0=1。 TMOD=0x03。TR0=1。showstring( 0x0100,0, string[1])。electricity= electricity+Random_Read(0x01 )。remnant= Random_Read( 0x02 )。count= Random_Read( 0x03 )。While( 1 ){ if(P1_2==0 ) { delay( 1 )。 If( P1_2==0) { P1_6=0。 If(P1_5==1){showstring( 0x0100,0, string[2])。electricity= electricity+Random_Readc(0x01 )。remnant= remnant+ Random_Readc( 0x01)。if (Random_Readc(0x01 )==0) showstring( 0x0100,0, string[4])。else showstring( 0x0100,0, string[3])。write_IICC( 0x01 , 0 )。write_IICC(0x02 , 0 )。write_IICC(0x03 , 0 )。}else showstring( 0x0100,0, string[5]。}}if (remnant=20) showstring( 0x0100,0, string[0])。if(electricity==0){P1_0=1。P1_1=0。}else {P1_0=0。P1_1=1。}Format(electricity, e)Format(remnant, r)showstring( 0x0100,0, e)。showstring( 0x0100,1, r)。}}附錄三 中英文資料The General Situation of AT89C51Chapter 1 The application of AT89C51Microcontrollers are used in a multitude of mercial applications such as modems, motorcontrol systems, air conditioner control systems, automotive engine and among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such highspeed eventbased applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the ponent and at the system level. Intel Platform Engineering department developed an objectoriented multithreaded test environment for the validation of its AT89C51 automotive microcontrollers. The goals of this environment was not only to provide a robust testing environment for the AT89C51 automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future microcontrollers. The environment was developed in conjunction with Microsoft Foundation Classes (AT89C51). The paper describes the design and mechanism of this test environment, its interactions with various hardware/software environmental ponents, and how to use AT89C51. IntroductionThe 8bit AT89C51 CHMOS microcontrollers are designed to handle highspeed calculations and fast input/output operations. MCS 51 microcontrollers are typically used for highspeed event control systems. Commercial applications include modems, motorcontrol systems, printers, photocopiers, air conditioner control systems, disk drives, and medical instruments. The automotive industry use MCS 51 microcontrollers in enginecontrol systems, airbags, suspension systems, and antilock braking systems (ABS). The AT89C51 is especially well suited to applications that benefit from its processing speed and enhanced onchip peripheral functions set, such as automotive powertrain control, vehicle dynamic suspension, antilock braking, and stability control applications. Because of these critical applications, the market requires a reliable costeffective controll