利用weibull在對比風(fēng)險(xiǎn)下的加速壽命試驗(yàn)規(guī)劃機(jī)械設(shè)計(jì)制造及自動化專業(yè)畢業(yè)設(shè)計(jì)外文翻譯-資料下載頁
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【正文】 981.[7] J. P. Klein and A. P. Basu, “Accelerated life tests under peting Weibull causes of failure,” Communications in Statistics—Theory and Methods, vol. A11, pp. 2271–2286, 1982.[8] D. S. Bai and Y. R. Chun, “Optimum simple stepstress accelerated lifetests with peting causes of failure,” IEEE Trans. Reliability, vol. 40, pp. 622–627, Dec. 1991.[9] W. Zhao and E. A. Elsayed, “An accelerated life testing under peting failure modes,” in The Annual Reliability and Maintainability Symposium, Jan. 2004.[10] W. Nelson, “A bibliography of accelerated test plans,” IEEE Trans. Reliability, vol. 54, pp. 194–197, Jun. 2005.[11] W. Nelson, “A bibliography of accelerated test plans part II—Reference,” IEEE Trans. Reliability, vol. 54, pp. 370–373, Sept. 2005.[12] W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. : John Wiley amp。 Sons, Inc., 1998.[13] W. Nelson and T. Kielpinski, “Theory for optimum censored accelerated life tests for normal and lognormal life distributions,” Technometrics, vol. 18, pp. 105–114, Feb. 1976.[14] W. Nelson and W. Q. Meeker, “Theory for optimum censored accelerated life tests for Weibull and extreme value distributions,” Technometrics, vol. 20, pp. 171–177, May 1978.[15] W. Q. Meeker and J. G. Hahn, Volume 10 of the ASQC Basic References in Quality Control: Statistical Techniques. Available from the American Society for Quality Control. Milwaukee, WI, 1985, 310 W. Wisconsin Ave, 53203.[16] F. G. Pascual, “Accelerated life test planning with independentWeibull peting risks with known shape parameter,” IEEE Trans. Reliability, vol. 56, pp. 85–93, March 2007.[17] F. G. Pascual, “Errata to “Accelerated life test planning with independent Weibull peting risks with known shape parameter”,” IEEE Trans. Reliability, to appear in.[18] K. Chaloner and K. Larntz, “Bayesian design for accelerated life testing,” Journal of Statistical Planning and Inference, vol. 33, pp. 245–259, Feb. 1992.[19] L. V. White, “An extension of the general equivalence theorem to nonlinear models,” Biometrika, vol. 60, pp. 345–348, Aug. 1973, (1973).[20] F. G. Pascual and G. Montepiedra, “Modelrobust test plans with applications in accelerated life testing,” Technometrics, vol. 45, pp. 47–57, Feb. 2003.[21] J. E. Dennis, D. M. Gay, and R. , “Algorithm 573—NL2SOL, an adaptive nonlinear leastsquares algorithm,” ACMTrans. Math. Software,vol. 7, pp. 369–383, Sep. 1981.[22] S. Kotz, N. Balakrishnan, and N. L. Johnson, Continuous Multivariate Distributions, Volume 1: Models and Applications. : John Wiley amp。 Sons, Inc., 2000.[23] R. Piessens, E. deDonckerKapenga, C. Uberhuber, and D. Kahaner, QUADPACK: A Subroutine Package for Automatic Integration. :Springer, 1983.弗朗西斯. Meeker教授的幫助下于衣阿華州立大學(xué)完成了他的博士學(xué)位。他是在華盛頓的副教授普爾曼，華盛頓州立大學(xué)。他收到杰克尤登獎最佳論說文紙，F(xiàn)rankWilcoxon獎和最佳實(shí)踐應(yīng)用于2000年在Technometrics紙。和ASA的杰出統(tǒng)計(jì)在2001年應(yīng)用獎。他的研究包括規(guī)劃加速壽命試驗(yàn)，可靠性數(shù)據(jù)分析，并進(jìn)行實(shí)際實(shí)驗(yàn)。授權(quán)許可。16
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