dielectricpropertiescharacterizationofthin-filmslesbyusingscanningnear-fieldmicrowavemicro(編輯修改稿)
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【文章內(nèi)容簡(jiǎn)介】 ?The axial symmetry mode is used. Schematic mesh for tip–dielectric sample at contact mode 7um 10um tip air thinfilm substrate CAVITY PERTURBATION THEORY Where E, H and f refer to the electric, magic fields and the resonant frequency, respectively. The subscript ‘0’ represents the unperturbed fields. Source: David M. Pozar, Microwave Engineering, Page 340342, John Willy amp。 Sons, INC. 1998 Relate the resonant frequency shift of the cavity to the change in the permittivity or permeability. ?Nonmagic samples, so Δμ=0. ?The numerator is the actual perturbed energy from the sample. ?Two Femlab structure, E and E0, are exported to a matlab script for calculating this integral. ?The denominator is the total energy from the cavity. ?It is difficult to calculate the total energy numerically. CAVITY PERTURBATION THEORY (continued) perturbed energy total energy The Total energy determination of bulk TiO2 ? Blue curve
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