材料科學(xué)中電子顯微鏡的各種技術(shù)介紹(存儲版)
【正文】 canning probe ? Stationary diffraction pattern Microanalysis: EDS, EELS, Microdiffraction, Convergent beam diffraction Imaging in AEM Scanning transmission electron microscopy mixing Hybrid imaging and EELS mapping Microanalysis in AEM XRay quantitative microanalysis XRay signal generation in TEM thin foil specimens Identification and elimination of spurious signals Optimization of the AEM for microanalysis XRay microanalysis Microanalysis limit EELS Electron Energy Loss Spectroscopy energy loss process in thin foil TEM specimens Where to find the energy loss electrons? Electron energy loss spectrometer Comparison of the signal generating process for EDS and EELS The energy loss spectrum EELS Microanalysis and the limit of analysis Conclusion remarks Comparison between EDS and EELS XRay signal generation in TEM thin foil specimens Fluorescence yield (w): w = 0 for Z ～ 5 (Boron k shell ionization) Z ～ 27 (Cobalt L shell) Z ～ 57 (lathanlum M shell) Optimization of the AEM for microanalysis XRay microanalysis Cliff and Lorimer : BAABBAIIkCC =CA+CB=100% ABCBCABCCBBCACCAACKKKIIKCCIIKCC=== Limit for microanalysis by EDS 1. Absolute accuracy 2
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