材料科學中電子顯微鏡的各種技術介紹-全文預覽
【正文】 The Dead layer below the gold layer: 37% of the 67% be transmitted! EELS: very high!! 75% of the energy loss electrons with a collection angle of 10 mrad 100% when collection angle is 30 mrad The energy loss spectrum (1) The zero loss peak (2) The low loss region of the spectrum DE 50eV plasmon peaks (3) High energy region of the spectrum DE= 50eV energy loss peak ionization edges preedge and postedge structure Microanalysis using ionization peaks (edges) The limitations in EELS analysis 1. Detection limits MDM: In 500197。 steel : 6at% 2. Specimen thickness 3. Spatial resolution Phase identification Micro Diffraction Limit of the Selected area electron diffraction (SAD) Micro diffraction the Ricke method convergent beam micro diffraction Limit of the Selected area electron diffraction (SAD) ? ) fCD BBS D?=D ?? 223 Convergent beam diffraction Terminology How to get a CBDP ZOLZ the Zero Order Laue Zone Thickness Measurement by CBDP HOLZ Higher Order Laue Zone HOLZ Lines Higher Order Laue Zone Lines ZAPS the zone Axis Patters Acquiring 3D symmetry information Phase identification summary Terminology ZOLZ Zero Order Laue Zone HOLZ Higher Order Laue Zone FOLZ First Order Laue Zone SOLZ Second Order Laue Zone Kikuchi Lines HOLZ Lines
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