qc中的統(tǒng)計方法(文件)
【正文】 Percent01020304050x Curve: Normal(Mu= Sigma=)Percent05101520253035x34 38 42 46 50 54 58 62 66Curve: Exponential(Theta=0 Scale=)Percent01020304050607080x Basic Pareto Analysis1 2 3 4 5 6 7020406080100Percent020406080100CumulativePercentCause of FailureCategories: 1 Contamination 2 Oxide Defect 3 Silicon Defect4 Corrosion 5 Metallization 6 Doping7 MiscellaneousPareto Analysis by ProcessN = 1620102030405060PercentProcessAN = 1061 2 3 4 5 6 70102030405060PercentProcessBFailure Causes: 1 Contamination 2 Oxide Defect 3 Corrosion4 Silicon Defect 5 Doping 6 Metallization7 MiscellaneousCleaningProcessPareto Analysis by Process and DayMarch 1N = 32010203040506070PercentMarch 2N = 35March 3N = 34March 4N = 25March 5N = 36N = 301 2 3 4 5 6 7010203040506070PercentN = 271 2 3 4 5 6 7N = 171 2 3 4 5 6 7N = 161 2 3 4 5 6 7N = 161 2 3 4 5 6 7Failure Causes: 1 Contamination 2 Oxide Defect 3 Corrosion4 Metallization 5 Doping 6 Silicon Defect7 MiscellaneousWhere Did The Problems Occur?March 10510152025CountMarch 2 March 3 March 4 March 51 2 3 4 5 6 70510152025Count1 2 3 4 5 6 7 1 2 3 4 5 6 7 1 2 3 4 5 6 7 1 2 3 4 5 6 7Failure Causes: 1 Contamination 2 Oxide Defect 3 Corrosion4 Metallization 5 Doping 6 Silicon Defect7 MiscellaneousSeverity: Highest 2Status: With Controls Without ControlsFitted Beta Distribution of Plate Gaps50 MeasurementsSpecifications and Curve: Lower=Upper=Beta(Theta=0 Scale= a= b=)Percent051015202530Plate Gap in cm （ ； 3 （ 。
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