【正文】 cluded that virtually any periodic signal can be generated using the technique developed.There are many different types of signal generators, with different purposes and applications (and at varying levels of expense). In general, no device is suitable for all possible applications. Hence the selection of signal generator is as per requirements. For SST1 Data Acquisition System requirements, we have developed a CAMAC based Test Signal Generator module using Reconfigurable device (CPLD). This module is based on CAMAC interface but can be used for testing both CAMAC and PXI Data Acquisition Systems in SST1 tokamak. It can also be used for other similar applications. Unlike traditional signal generators, which are embedded hardware, it is a flexible hardware unit, programmable through Graphical User Interface (GUI) developed in LabVIEW application development tool. The main aim of this work is to develop a signal generator for testing our data acquisition interface for a large number of channels simultaneously. The module front panel has various connectors like LEMO and D type connectors for signal interface. The module can be operated either in continuous signal generation mode or in triggered mode depending upon application. This can be done either by front panel switch or through CAMAC software mands (for remote operation). Similarly module reset and trigger generation operation can be performed either through front panel push button switch or through software CAMAC mands. The module has the facility to accept external TTL level trigger and clock through LEMO connectors. The module can also generate trigger and the clock signal, which can be delivered to other devices through LEMO connectors. The module generates two types of signals: Analog and digital (TTL level). The analog output (single channel) is generated from Digital to Analog Converter through CPLD for various types of waveforms like Sine, Square, Triangular and other wave shape that can vary in amplitude as well as in frequency. The module is quite useful to test up to 32 channels simultaneously with different frequency TTL level square wave signal (digital signal) in a group of 8 channels. There are four such groups with similar set of frequencies. The different frequencies in group help us to test phase shifts between different channels. We have tested 32 channels of PXI Data acquisition modules simultaneously with the developed hardware.附錄3 原理圖附錄4 源程序includedefine uchar unsigned chardefine uint unsigned intdefine DAdata P0sbit DA_S1= P2^0。 sbit key= P3^2。 uchar THtemp,TLtemp。 uchar waveform。uchar idata wavefreq[3]={1,1,1}。uchar idata lcd_hang2[16]={f= Hz }。uchar code waveTL[]={ 0x06,0x8a, 0x10,0x4e, 0x78,0x93, 0xa8,0xb3, 0xbe,0xc6, 0xac,0xde,0x48,0x7a,0x99,0xaf,0xbb,0xc8,0xd0,0xde, 0xff,0x8e,0x5a,0x41,0x32,0x28,0x20,0x1b,0x17,0x0e}。uchar code sine_tab[256]={ 0x80,0x83,0x86,0x89,0x8d,0x90,0x93,0x96,0x99,0x9c,0x9f,0xa2,0xa5,0xa8,0x ab,0xae,0xb1,0xb4,0xb7,0xba,0xbc, 0xbf,0xc2,0xc5,0xc7,0xca,0xcc,0xcf,0xd1,0xd4,0xd6,0xd8,0xda,0xdd,0xdf,0xe1, 0xe3,0xe5,0xe7,0xe9,0xea,0xec, 0xee,0xef,0xf1,0xf2,0xf4,0xf5,0xf6,0xf7,0xf8,0xf9,0xfa,0xfb,0xfc,0xfd,0xfd,0xf e,0xff,0xff,0xff,0xff,0xff,0xff, 0xff,0xff,0xff,0xff,0xff,0xff,0xfe,0xfd,0xfd,0xfc,0xfb,0xfa,0xf9,0xf8,0xf7,0xf6, 0xf5,0xf4,0xf2,0xf1,0xef, 0xee,0xec,0xea,0xe9,0xe7,0xe5,0xe3,0xe1,0xde,0xdd,0xda,0xd8,0xd6,0xd4,0xd 1,0xcf,0xcc,0xca,0xc7,0xc5,0xc2, 0xbf,0xbc,0xba,0xb7,0xb4,0xb1,0xae,0xab,0xa8,0xa5,0xa2,0x9f,0x9c,0x99 ,0x9 6,0x93,0x90,0x8d,0x89,0x86,0x83,0x80, 0x80,0x7c,0x79,0x76,0x72,0x6f,0x6c,0x69,0x66,0x63,0x60,0x5d,0x5a,0x57,0x 55,0x51,0x4e,0x4c,0x48,0x45,0x43, 0x40,0x3d,0x3a,0x38,0x35,0x33,0x30,0x2e,0x2b,0x29,0x27,0x25,0x22,0x20,0x 1e,0x1c,0x1a,0x18,0x16 ,0x15,0x13, 0x11,0x10,0x0e,0x0d,0x0b,0x0a,0x09,0x08,0x07,0x06,0x05,0x04,0x03,0x02,0x 02,0x01,0x00,0x00,0x00,0x00,0x00,0x00, 0x00,0x00,0x00,0x00,0x00,0x00,0x01,0x02 ,0x02,0x03,0x04,0x05,0x06,0x07,0 x08,0x09,0x0a,0x0b,0x0d,0x0e,0x10, 0x11,0x13,0x15 ,0x16,0x18,0x1a,0x1c,0x1e,0x20,0x22,0x25,0x27,0x29,0x2b,0 x2e,0x30,0x33,0x35,0x38,0x3a,0x3d, 0x40,0x43,0x45,0x48,0x4c,0x4e,0x51,0x55,0x57,0x5a,0x5d,0x60,0x63,0x66 ,0 x69,0x6c,0x6f,0x72,0x76,0x79,0x7c,0x80}。 for(x=z。x) for(y=110。y)。 if(wavecount64) wavecount=0。 DA_S1=1。 DA_S1=0。 }void square_out() { judge=~judge。 else DAdata=0x00。 //打開(kāi)位輸入寄存器 DA_S1=1。sbit rw=P2^3。void write_(uchar ){ rs=0。 lcd_ports=。 lcden=1。 lcden=0。 lcden=0。 delay(5)。 delay(5)。 }void disp_lcd(uchar addr,uchar *temp1){ uchar num。 delay(1)。num16。 delay(1)。 rw=0。 write_(0x0c)。 write_(0x01)。 disp_lcd(0x80,amp。 //在第一行顯示 disp_lcd(0xc0,amp。 //在第二行顯示 }/********************1602液晶函數(shù)聲明結(jié)束*********************/void main(){ uchar i=0。 DAdata=0。 init_lcd()。 TMOD=0x01。 ET0=1。 EA=1。 TL0=TLtemp。 else if(waveform==1) triangle_out()。}void key_int0() interrupt 0{ uchar keytemp。 //總頻率 EA=0。 //關(guān)總中斷與定時(shí)器 delay(5)。0xf0。 if(waveform2) waveform=0。 case 0xd0: //頻率按規(guī)定單位依次增加 wavefreq[waveform]++。 break。 if(wavefreq[waveform]1) wavefreq[waveform]=10。case 0x70: DA_S2=1。 }THtemp=waveTH[waveform*10+(wavefreq[waveform]1)]。total_freq= wavefreq[waveform] * freq_unit[waveform]。 //在液晶中顯示個(gè)位，(0x30 在液晶顯示中表示數(shù)字)total_freq/=10。 //在液晶中顯示時(shí)十位total_freq/=10。 //在液晶中顯示時(shí)百位total_freq/=10。 //在液晶中顯示時(shí)千位disp_lcd(0x80,amp。 //在第一行顯示disp_lcd(0xc0,lcd_hang2)。 T