礦物材料現(xiàn)代測(cè)試技術(shù)1緒論-展示頁
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【正文】 Light source: characteristic x ray Instrument: powder x ray diffractmeter Mainly to determine the mineral phase, qualitative or quantitative. In some cases, to determine the structure of the new material Only valid to the crystal. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 37 Transparent Electron Microscope (TEM) Light source: electron beam Sample: very very thin (010nm) To determine the structure of the sample in a very small region. (nm region) It can directly observe the distribution of the crystal lattice 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 38 Infrared Spectroscope (IR): Light source: Infrared light Sample: solid(powder), liquid, gas. Check the adsorption of the sample to the light from light source. Different chemical bonds can adsorb different wavelength of the light. To determine the existence of the chemical bonds in the sample (material), also can be used to determine the mineral phase (different mineral has different chemical bonds: their kinds and strength). Adsorption spectroscope. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 39 Laser Raman Spectroscope (RAMAN): Light source: laser with a certain wavelength. Sample: solid, liquid, gas. When excited by laser, the chemical bonds in the material can radiate a certain wavelength of light. similar with IR. But IR is a kind of adsorption spectroscope. Radiation spectroscope. To determine the existence of the chemical bonds in the sample (material). 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 40 Surface Morphological Observation Naked eyes: 1* Microscope: 40400, (1,000 max) Scanning Electron Microscope (SEM) 10,000 sample should be conductive or be made to be conductive. Environment SEM(ESEM) : similar with SEM. But the sample can be conductive or not. Field Emitted SEM (FSEM): 1,000,000 conductive. Transparent Electron Microscope (TEM): 1,000,000 similar with FSEM, but TEM can also do structural analysis. Scanning tunneling microscopy (ASM): to observe the arrangement of the atoms (surface layer) directly. Sample should be conductive. Atomic force microscopy(AFM): similar with ASM, but the sample may conductive or not. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 41 (SEM) (ESEM) (FSEM) light source: electron beam. sample: solid. when excited by electron beam, the sample can produce the secondary electron. By detecting the secondary electron, the microregion morphological characteristic can be obtained. (TEM): similar with SEM, but the electron beam transmit the sample 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 42 (ASM): (AFM): Using the principle of the electron current (very very small) (ASM) and the force (AFM) between atoms when the atoms are very near. 武漢理工大學(xué)資環(huán)學(xué)院 管俊芳 43 physical and chemical properties Thermal Analysis: to determine the changes of
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