外文翻譯--基于ds18b20分組方式溫度測試系統(tǒng)設(shè)計-其他專業(yè)-展示頁
2025-01-31 10:03本頁面
【正文】 nsforms data, performs the wireless munication, manages keyboard and so on. For the convenience of the procedure debugging and the reliability, the module design is adopted, mainly including the keyboard processing module, the wireless munication module, the module of temperature collection and processing, the display module and so on. The software flow chart is shown as Fig 8 After the reversion of add power 89C52 selfchecks first, then allocates each branch procedure module. The chief procedure manages the keyboard, initializes the system and transfers each functional module. The haul line is kept to perform DS18B20 edit mission. 120 points serial number of DS18B20 is read by the keyboard and display coordination and numbered into DS1225Y. First the wireless module is set up as the reception state to receive the collection parameters and start the order (The transmission content is sent by pack 。the writing period of one bit is 60us120us。 畢業(yè)設(shè)計外文資料翻譯 外文出處： 2021 Second IEEE Conference on Industrial Electronics and Applications 學(xué) 院： 信息工程 系： 電子信息工程 專 業(yè)： 電子信息工程 班 級： 學(xué) 號： 學(xué)生姓名： 外文原文： A Design of the Temperature Test System Based on Grouping DS18B20 LI Ping ZHOU Yucai Xiangjun ZENG YANG Tingfang Changsha University of Science and Technology, Changsha 410077, Hunan, P. R. China. EMail: Abstract All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software。 as a result, the speed of alternate test advances distinctly. Key words DS18B20 Group ,temperature test, time spent on the alternate test. I. INTRODUCTION As the simple structure, convenient installment, low loss and wide range of temperature test, DS18B20 temperature test sensors are applied to the fields which need the multipoint temperature test, such as the chemical industry, the grain, the environment supervision and so on. Because of the adoption of one bus in the DS18B20 multipoint temperature test system, all DS18B20 are hung on one bus, and then the temperature conversion value of each test point is read by turns. As the conversion value must be read after readingpin state for 8 times, and position and store data must be moved, so time spend much in reading one point of the data system by every time. If the temperature test system is largescaled, the system loss caused by it is rather much, and then the alternate test speed of the system decreases obviously, which influences the efficiency of the multipoint temperature test system seriously. In this paper, DS18B20 are hung on some I/O buses by grouping DS18B20 evenly, and the conversion temperature data is obtained by reading the state of DS18B20, then the system loss decreases and the alternate test speed increases obviously, which won’t influence the precision
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