【正文】
相悲各問(wèn)年。t know Low Hanging Fruit 底處的果實(shí) Seven Basic Tools 統(tǒng)計(jì)七工具 Process Entitlement 目標(biāo) Sweet Fruit 最甜的果實(shí) Design for Manufacturability Bulk of Fruit 大量的果實(shí) Process Characterization and Optimization過(guò)程優(yōu)化 Ground Fruit 掉到地上的果實(shí) Logic and Intuition基本常識(shí) WHAT LEVEL ARE YOU? ? 靜夜四無(wú)鄰,荒居舊業(yè)貧。t search for what we don39。t know We can39。如一件產(chǎn)品、一次服務(wù)、一個(gè)過(guò)程等。 1s 以?xún)?nèi) ?% 的數(shù)據(jù)落在177。t question We don39。t act on what we don39。 Defect: 缺陷,任何未達(dá)到要求的特性 DPU (Defects per unit) = Defects / Unit = 缺陷數(shù) /單元數(shù) PPM (Defects per Million Units) = Defects / Unit x 106 =缺陷數(shù) /(單元數(shù) X 106 ) TOP (Total Opportunities) = Units * Opportunities (總機(jī)會(huì)) =單元數(shù) X 每單元發(fā)生缺陷的 機(jī)會(huì) DPO (Defects per Opportunity)=Defects/TOP (每個(gè)機(jī)會(huì)中產(chǎn)生的缺陷數(shù)) =缺陷數(shù) /總機(jī)會(huì) DPMU(Defects per million units)=DPUx 106 ( 每百萬(wàn)單元中的缺陷數(shù)) DPMO (Defects per Million Opportunities) = Defects / TOP x 106 = 缺陷數(shù) / TOP x 106 First Pass Yield(一次合格率 )=全過(guò)程中未產(chǎn)生任何缺陷的單元數(shù) /總單元數(shù) Rolled Yield (單元的缺陷數(shù)為零的幾率) ( The likelihood that any given unit of product will contain 0 defects) YRT= e DPU YRT = P(ND) * P(ND) * P(ND) *......P(ND)n P( ND) 表示零缺陷的幾率 Ynorm (Normalized Yield 正態(tài)合格率) =1DPO= n YRT (連續(xù)過(guò)程的平均合格率) n=過(guò)程的個(gè)數(shù) Zlt=NormSinv(Ynorm) ( 在電子表格 Excel 的函數(shù) fx 中的‘統(tǒng)計(jì)類(lèi)’中, 或查表) Zst=Zlt+ 計(jì)算 s個(gè)數(shù)的概念與公式 (非連續(xù)數(shù)據(jù)) 計(jì)算 s個(gè)數(shù)實(shí)例 M(每單元產(chǎn)生缺陷的機(jī)會(huì)) =50 Units( 單元數(shù))