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前瞻網(wǎng)路安全處理器及相關(guān)soc設(shè)計(jì)與測(cè)試技術(shù)研發(fā)(已修改)

2025-02-25 08:31 本頁(yè)面
 

【正文】 Network Security Processor and the Related SOC Design and Test Technologies Bist for RAm IN SecondsJuly , 2023Memory Testing Problem SolutionsuProblem: memory manufacturing is not perfectuNeed testing, diagnosis, and repairuRAMSES: RAM/Flash fault simulatoruTAGS: RAM/Flash test algorithm (pattern) generatoruBRAINS: RAM BIST generatoruFAME: memory failure analyzerDesign(Layout)DefectInjectionFaulty Cell BehaviorFaultModelsFaultModelsTestAlgorithmsBuiltInSelfTestBuiltInSelfRepairTester2Memory BIST Automation FlowBRAINS:BIST for RAMs in SecondsBISTIntermediateDescriptionSimulation/Synthesis/PR FlowBRAINSgbrain
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