【正文】 CDE)1. 綜合判斷defect比率31llppm與往日紀錄相近，所以數(shù)據(jù)可信。6. (板疹圖concentration diagram)l 將出現(xiàn)defect的孔位在機板圖上用色筆加以標記，制作成一張板疹圖(未附圖)，可供必要時的解析之用。數(shù)據(jù)透視表三元表defects 二元表板間位置板間其它unsoldered connectionssolder shorts總計defects ABCDE總計中右A其它10Bunsoldered connections22Csolder shorts108D總計561281054E中左A二元表板間B位置ABCDE總計C中右6D中左14E右邊62右邊A左邊58B總計561281054C二元表defects D位置其它unsoldered connectionsolder shorts總計E中右6左邊A中左14B右邊62C左邊58D總計1022108E總計Paired Comparisons (分對比較)Experiment 2A從Experiment 1的九組數(shù)據(jù)中，取出四組來比對中間「良板」與外側「劣板」的差別，其中左、右的板心對粗心的偏離，數(shù)據(jù)詳如表。(對策) (Corrective Action)引入比較精密的鉆孔設備，而且在生產(chǎn)在線改用更緊的孔徑規(guī)格。表3碼別制程參數(shù)高水平低水平A熱氣刀壓力Psi1410B預熱區(qū)溫度Profile1Profile2C助焊劑密度gm/.D輸送帶速度ft/min46E輸送帶坡度(。將實驗成果及其判解編制成表5。我們將表7各格內(nèi)的中位數(shù)，填入表8進行變異分析的表7表8CDECDCEDECDEoutput+++++++8+++32+++25+++21+++20+++22+++15+++4249132193953(結論)(1)分解后以三階交效CDE達53點為最高，C的49點排名第二，E是第三。隨機式的于C制程及B制程各進行十組實驗，并將成果列示于表9。(3)在上述的參數(shù)水平下，制程的defect rate可望再降到3OPPm，又有4倍以上的效益。to l00ppm。Positrol planKey Variable(What)WhoControlsHowControlledWhereControlledWhen(HowFrequently) ControlledFlux DensitySolderTechnicianSpecificGravity MeterFluxContainerOnce/HourConveyorAngleSolderTechnicianMachineSettingConveyorOnce/DayConveyorSpeedSolderTechnicianCounterConveyorEach ModelChangeProcess CertificationQuality IssueControl MechanismSolder TechnicianCertification of petency 。(高于現(xiàn)用水平)將隨機進行的實驗成果(每格十組)整理在表10。B制程:、輸送帶速度4ft/min和輸送帶坡度7。Variables CombinedOutputMedianControl LimitsInterpretationCHDHEHRLCLDLELRH743446 R is unimportantSearch is finishedDefect「中位管制界限」QLRH =43，[46 (~)] QHRL=7 ，[4 (–~)] R為弱因族結論參數(shù)C、D和E可以聯(lián)合達成第一階段的成果。(2)由于D: =42::1，所以全高水平的確優(yōu)于全低水平。Variables ResearchExperiment 4Experiment1的結論，波焊機臺是defect問題的主要根源。(結論):機板上有兩孔其口徑過粗，以致容易發(fā)生unsoldered connections。l 從板疹圖的分析獲知:「機板上有兩處洞孔最易發(fā)生unsoldered connections。5. (lD圖意)l defect mode中以solder shorts居最多高達108點，unsoldered connections其次22點，及其它有10點?？膳湟蜃覣 B CD F G H列 行1 2 34 5 6 71 1 11 1 1 121 1 12 2 2 231 2 21 1 2 241 2 22 2 1 152 1 21 2 1 262 1 22 1 2 172 2 11 2 2 182 2 12 1 1 2成分 AA B B A BC C C A B CYATES算法,求偏差平方和【例2】如【例1】求因子之效果差及各種偏差平方和代號數(shù)據(jù)(1)(2)(3) 效果差(3)2/8名稱(1)25162898CTc3131224/8SCb564864/8SBbc86200SBCa318416/8SAac330636/8SACab402864/8SABabc222416/8SABC【練習1】：試計算如下之因子之效果差及各種偏差平方和A1A2B1B2B1B2C1D12423D23128C2D165686D2810910解ABCDDATA1234S11111251939165CT1112d3142012663SD1121c65195115SC1122cd8151076869SCD1211b4431989SB1212bd11529675SBD1221cd5113975SCD1222bcd1096717877SBCD2111a219187SA2112ad22108873SAD2121ac6311177SAC2122acd95857487SACD2211ab301187SAB2212abd8387473SABD2221abc8653773SABC2222abcd1076818491SABCD散布圖定公差通常產(chǎn)品之規(guī)格包括兩種數(shù)值，一為數(shù)值表示，另一為范圍表示，數(shù)值部分稱為規(guī)格值，范圍表示稱為公差，制程條件也有此兩種數(shù)值，因此當制程條件決定時(田口稱為參數(shù)設計)除了數(shù)值部份，亦應檢討重要條件之公差范圍(田口稱為公差設計)，使制程規(guī)格明確，以方便制程管制。C(L2)－5。s test for two independent samples.（5） 判斷所選擇因子中有影響的大要因存在，可進行步驟2（6）如果 判斷所選擇的因子中無影響大要因存在，回到步驟1步驟2：消去(elimination)逐一確認要因中是那一個重要(Red X or Pink X)，同時去除不重要因子（消去法）作法：從第一個變量稱為A開始，選擇好的條件AH，AL，其余的變量組合為差的組合稱為RL，RH。s t, used in example for these data, gave closely similar results for the significance level and the confidence limits. l For two independent samples of unequal sizes。s reliability requirement of perfect operation at 40 C .The worst units could only reach 0 C before malfunction .The hour meter consists of a solenoid cell with a shield to concentrate the electrical charge which pulses at regular intervals .The pulse triggers a solenoid pin , which in turn causes a verge arm , or bell crank , to trip the counter , advancing it by one unit .The counter is attached to a numeral shaft containing numeral wheels .These numeral wheels are separated from each other by idler gears , which rotate on an idler gear shaft .Both the idler gear shaft and the numeral shaft are attached to the mainframe , made of hard white plastic .The pulsing rh